SAN FRANCISCO, Dec. 5, 2012 /PRNewswire/ -- UBM Tech's Test & Measurement World today announced the finalists of the Best in Test Awards competition, selected by the editors of Test & Measurement World. The awards recognize the best in test products and test professionals.
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The program comprises three main categories – the Best in Test Product Awards, the Test of Time Awards, and Test Engineer of the Year Award. Test & Measurement World readers are asked to vote online for the award winners at http://tmworld.com/electronics-blogs/other/4402438/Best-in-Test-voting-is-underway through December 31, 2012. Winners will be announced during the Best in Test 2013 Awards ceremony on January 31, 2013 during a ceremony held in the Chiphead Theater in conjunction with DesignCon 2013, which takes place January 28-31, 2013 at the Santa Clara Convention Center in Santa Clara, California.
"Since 1991 we have had the annual tradition of selecting the Best in Test Award winners," said Janine Love, Editor in Chief, Test & Measurement World, UBM Tech. "We received an outstanding group of new innovative products and services this year. We look forward to hearing what our readers think of these selections and which products they believe will define our industry for years to come."
The Best in Test Product Awards honor important and innovative new products and services in the electronics test and measurement industry. Products from all areas of electronics testing and inspection are eligible. The annual Test of Time Award is presented to a product that continues to provide state-of-the-art service more than five years after its introduction. The Test Engineer of the Year Award pays tribute to the important contributions test engineers make to the quality of electronics components, products and systems. The award winner receives a $10,000 educational grant, courtesy of sponsor National Instruments, which is presented to an engineering school designated by the winner.
The Best in Test finalists include:
ATE/Production Test
- Diamondx Test Platform; LTX-Credence
- Advantest T2000 Integrated Massive Parallel Test Solution (IMS); Advantest Corporation
- TR7680 3D Automated X-Ray Inspection; Test Research, Inc.
- Multi-Function Application Board for in-circuit testers; Teradyne
- 7700 Integrated Microwave Test System; Aeroflex
- WLAN Boundary Scan Controller SFX/WSL1149-(x); GOEPEL electronic
Compliance Test
- R&S ESR EMI test receiver; Rohde & Schwarz
- R&S VTC Video test center; Rohde & Schwarz
- Fluke Networks TS'54 TDR VDV telephone test set; Fluke Networks
Data Acquisition
- PXIe-9848: 8-CH 14-bit 100 MS/s High-Speed PXI Express Digitizer; ADLINK Technology
- QuantumX MX1615 Strain Gauge Bridge Amplifier; HBM Test & Measurement
- Stand-Alone NI CompactDAQ System; National Instruments
- DT8824-HV Ethernet Data Acquisition Module; Data Translation, Inc.
Digital Multimeters
- GX2065 - 6.5 Digit, Performance DMM & 3MS/s Digitizer; Geotest-Marvin Test Systems
- U1177A Infrared-to-Bluetooth® adapter for multimeters; Agilent Technologies
LTE/Wireless Test
- Spirent Hybrid Location Technology Solution (HLTS); Spirent Communications
- RP-5300 Multi-Channel RF Recorder; Averna
- ZT8201 6 GHz VSA and VSG One-Box Solution; ZTEC Instruments
- ACE MX2 MIMO channel emulator; Azimuth Systems
- EB Propsim F32 radio channel emulator; Elektrobit (EB)
- Spirent Landslide Wi-Fi Offload Gateway Test Solution; Spirent Communications
Machine Vision/Inspection
- TR7007 SII Solder Paste Inspection; Test Research, Inc.
- OptiCon SPI-Line 3D Solder Paste Printing Measurement; GOEPEL electronic
- Piranha HS NIR 8k camera; Teledyne DALSA
Optical/Network Test
- Landslide Mobile Infrastructure Security Test Solution; Spirent Communications
- MultiFiber Pro Optical Power Meter and Light Source; Fluke Networks
- OneTouch AT Network Assistant; Fluke Networks
- TeraVM Virtualized Network Solution; Shenick Network Systems
- Xair LTE Basestation Validation Solution; Ixia
- AFL Noyes M310 OTDR; AFL
- CS260-10 Live PON OTDR; AFL
- FLX380 FlexTester Handheld OTDR; AFL
- AFL-NOYES FOCIS Fiber Optic Connector Inspection System; AFL
Power Supply
- DL Series Electronic DC Loads; Global Test Solutions
- ASD Programmable Precision High-Power DC Power Supply; AMETEK Programmable Power, Inc
- Model 2657A High Power System SourceMeter® instrument; Keithley Instruments, Inc.
- Aktakom APS -73xxL Series of Programmable Power Supplies; T&M Atlantic
- U2020 X-series USB peak power sensors; Agilent Technologies
RF/MW Test
- RF Studio signal-processing and analysis tools; Averna
- DOCSIS Channel Emulator; Averna
- Agilent U1810B USB Coaxial Switch, DC - 18 GHz, SPDT; Agilent Technologies
- NI PXIe-5644R RF vector signal transceiver (VST); National Instruments
- 3550 Digital Radio Test System; Aeroflex
- Series 7000 Radio Channel Replicator; Eastern Optx Inc.
- PSM3000, PSM4000 and PSM5000 Series RF and Microwave Power Sensors/Meters; Tektronix
Oscilloscopes
- DS2000 Digital Oscilloscope; Rigol Technologies
- HDO High Definition Oscilloscopes; Teledyne LeCroy
- LabMaster 10 Zi 65 GHz Oscilloscope; Teledyne LeCroy
- Tektronix Visual Trigger; Tektronix
- InfiniiVision 4000 X-Series Oscilloscope; Agilent Technologies
- DLM4000 Mixed Signal Oscilloscope; Yokogawa Corp
- Infiniium 90000 Q-Series Oscilloscopes; Agilent Technologies
Semiconductor Test
- ScanWorks® FPGA-Controlled Test (FCT) Memory Test Instruments; ASSET Intertech
- T2000 LJC16 6-channel, low-jitter-clock module; Advantest
- Tessent TestKompress with Cell-Aware Testing; Mentor Graphics
Signal Analyzers
- M9703A AXIe High-Speed Digitizer, 8-channel, 12-bit, up to 3.2 GS/s (DDC capability); Agilent Technologies
- VectorStar ME7838A (frequency extended to 750GHz); Anritsu Company
- DSA815-TG spectrum analyzer; Rigol Technologies
- CS1104 Scout Broadband Signal Analyzer; Aeroflex
- Tektronix OM4000 Coherent Lightwave Signal Analyzer; Tektronix
Signal Integrity/High-speed test
- MP1800A 32G Multi-channel Solution; Anritsu Company
- BERTScope Bit Error Rate Tester; Tektronix
- Introspective ESP software-defined, real-time BER / signal-integrity analyzer instrument-on-chip; DFT Microsystems
Signal Source
- M9381A PXIe Vector Signal Generator; Agilent Technologies
- 33500B Series Waveform Generators with Trueform Technology; Agilent Technologies
- MG3710A Vector Signal Generator; Anritsu Company
- MXG X-Series Signal Generator; Agilent Technologies
- GX1649 - 64 Channel PXI Arbitrary Waveform Generator and D to A; Geotest-Marvin Test Systems
- ZT8751 6 GHz Vector Signal Generator; ZTEC Instruments
- AFG2000 Series Arbitrary/Function Generator; Tektronix
Software
- TestShell 4.8 for lab management; QualiSystems
- Certus 2.0 ASIC Prototyping Debug Solution; Tektronix
- TOSCA Testsuite 7.5; TRICENTIS
- Tessent IJTAG; Mentor Graphics
- SDAIII CompleteLinQ multi-lane serial data analysis software; Teledyne LeCroy Black Belt 5.0 .Automated Test Data Collection; IntraStage
The Test of Time finalists include:
- PZ4000 Power Analyzer (1999); Yokogawa Corporation
- WaveSurfer Xs Scope (2006); Teledyne LeCroy Corp.
- ATEasy (1991) Test Executive and Test Development Softwarer Suite; Geotest - Marvin Test Systems
- TestStation (1999) ATE Low Voltage Tester; Teradyne, Inc.
- Aardvark (2003) I2C/SPI Host Adapter; Total Phase
- T12 Digital Torque Transducer (2005); HBM Test and Measurement
- DesignWare STAR Memory System (2001); Synopsys
- SoMat eDAQlite (2004) Mobile data acquisition system; HBM Test and Measurement
- MT9510 Pick and Place Test Handler (1997); Multitest
- TOSCA Test Suite 1.0 (2006); Tricentis
The Test Engineer of the Year finalists include:
- Daniel Chow, PhD, Altera
- Steve Sandler, Picotest
- Peter Spitzer, TRICENTIS
- Kevin Henderson, Qualcomm Atheros
- David Finnie, CACI
To vote on the award finalists, visit: http://tmworld.com/electronics-blogs/other/4402438/Best-in-Test-voting-is-underway
http://www.tmworld.com/article/520453-Finalists_for_T_MW_s_2012_awards.php
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For more information on the Best in Test Awards, please contact:
Janine Love, Editor in Chief, Test & Measurement World
M: 973.864.7238, E: janine.love@ubm.com
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Janine Love
https://profnet.prnewswire.com/Subscriber/ExpertProfile.aspx?ei=109766
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